Sift X ray tomography during ELMs and impurity injection in jet

L.C.Ingesson; B.Alper; H.Chen

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Sift X ray tomography during ELMs and impurity injection in jet

机译：ELMs中的X射线断层扫描和喷射中的杂质注入

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The soft X ray diagnostic at JET views the plasma from six directions with a total of 215 lines of sight. The good coverage of the plasma makes it possible to make detailed tomographic reconstructions of the soft X ray emission during various conditions. One of the tomography methods applied at JET is discussed: a grid constrained optimization method that uses anisotropic smoothness on flux surface as regularization. This method has made it possible to study in detail the transport of heavy trace impurities injected into the plasma by laser blow-off. Impurity injection experimental in hot ion H mode and optimized shear plasmas are presented and discussed.

机译：JET的软X射线诊断仪从六个方向观察了等离子体，共有215条视线。等离子体的良好覆盖使得可以在各种条件下对软X射线发射进行详细的层析成像重建。讨论了在JET上使用的一种层析成像方法：一种网格约束优化方法，该方法使用了通量表面的各向异性平滑度作为正则化。该方法使详细研究通过激光吹扫注入等离子体中的痕量重杂质的传输成为可能。介绍并讨论了在热离子H模式下进行杂质注入实验和优化的剪切等离子体。

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来源
《Nuclear fusion》 |1998年第11期|p.1675-1694|共20页
作者
L.C.Ingesson; B.Alper; H.Chen;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类原子核物理学、高能物理学;
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2. Seeding of impurities in JET H-mode discharges to mitigate the impact of ELMs [J] . Jachmich S., Maddison G., Beurskens MNA., Plasma physics and controlled fusion . 2002,第9期

机译：在JET H模式放电中注入杂质以减轻ELM的影响
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7. Soft X-ray tomography during ELMs and impurity injection in JET [O] . Ingesson, L C, Alper, B, Chen, H, 1998

机译：ELM和JET中的杂质注入过程中的软X射线断层扫描

Sift X ray tomography during ELMs and impurity injection in jet

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