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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Depth profiles of energy deposition near incident surface irradiated with swift heavy ions
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Depth profiles of energy deposition near incident surface irradiated with swift heavy ions

机译：快速重离子辐照后入射表面附近能量沉积的深度分布

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摘要

Systematic trend of nm-scale energy deposition depth profiles near incident surface owing to irradiation by swift heavy ions in the energy range of 1-40 MeV is explained by track-structure calculation. To explain the trend, the depth profiles of energy deposition by protons and heavy ions in liquid water were calculated by the trackstructure simulation code RITRACKS. The calculation shows that the energy deposition at the incident surface is 40% less than that in the depth, and energy deposition builds up in the first 3 nm, reaching equilibrium. The energy deposition depth profiles owing to different ions are almost scalable. This trend is almost independent from the incident ion species or energy because the energy deposition near the surface is attributed to the deltarays below 500 eV regardless of the incident ion species and energy.
机译：轨道结构计算解释了由于能量范围为1-40 MeV / n的快速重离子的辐照，入射表面附近的纳米尺度能量沉积深度分布的系统趋势。为了解释这种趋势，通过轨迹结构仿真代码RITRACKS计算了质子和重离子在液态水中的能量沉积深度分布。计算表明，入射表面的能量沉积比深度处的能量沉积少40％，并且能量沉积在前3 nm处累积，达到平衡。由于不同离子的能量沉积深度分布几乎是可缩放的。这种趋势几乎与入射离子种类或能量无关，因为无论入射离子种类和能量如何，表面附近的能量沉积都归因于低于500 eV的三角洲。

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