High-density three-dimensional measurements through multilayer perceptron calibration and statistical band-limited patterns

著录项

• 来源
  《Optical engineering》 |2018年第7期|070501.1-070501.4|共4页
• 作者

  Eugene Wong; Andreas Walter Stark; Holger Babovsky; Richard Kowarschik;

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• 作者单位

  Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

  Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

  Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

  Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

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• 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  three-dimensional shape measurement; optical metrology; photogrammetry; structured light system; camera calibration; neural network;

  机译：三维形状测量;光学计量摄影测量结构化照明系统;相机校准;神经网络;