...
首页> 外文期刊>Optical engineering >High-precision terahertz frequency modulated continuous wave imaging method using continuous wavelet transform
【24h】

High-precision terahertz frequency modulated continuous wave imaging method using continuous wavelet transform

机译:连续小波变换的高精度太赫兹频率调制连续波成像方法

获取原文
获取原文并翻译 | 示例
           

摘要

Inspired by the extensive application of terahertz (THz) imaging technologies in the field of aerospace, we exploit a THz frequency modulated continuous-wave imaging method with continuous wavelet transform (CWT) algorithm to detect a multilayer heat shield made of special materials. This method uses the frequency modulation continuous-wave system to catch the reflected THz signal and then process the image data by the CWT with different basis functions. By calculating the sizes of the defects area in the final images and then comparing the results with real samples, a practical high-precision THz imaging method is demonstrated. Our method can be an effective tool for the THz nondestructive testing of composites, drugs, and some cultural heritages.
机译:受到太赫兹(THz)成像技术在航空航天领域的广泛应用的启发,我们利用太赫兹频率调制连续波成像方法和连续小波变换(CWT)算法来检测由特殊材料制成的多层隔热板。该方法使用调频连续波系统捕获反射的太赫兹信号,然后由CWT处理具有不同基函数的图像数据。通过计算最终图像中缺陷区域的大小,然后将结果与真实样本进行比较,证明了一种实用的高精度太赫兹成像方法。我们的方法可以成为复合材料,药物和某些文化遗产的太赫兹无损检测的有效工具。

著录项

  • 来源
    《Optical engineering》 |2018年第2期|023108.1-023108.7|共7页
  • 作者单位

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

    Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    terahertz; image analysis; nondestructive testing;

    机译:太赫兹图像分析;非破坏性测试;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号