Surface topography measurement of plasma-facing materials by dual-wavelength phase-shifting speckle interferometry technique

著录项

• 来源
  《Optical engineering》 |2018年第1期|014109.1-014109.9|共9页
• 作者

  Xiaoqian Cui; Hongbei Wang; Mengge Zhao; Yuanbo Li; Hongbin Ding;

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• 作者单位

  Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Chinese Ministry of Education, School of Physics, Dalian, China;

  Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Chinese Ministry of Education, School of Physics, Dalian, China;

  Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Chinese Ministry of Education, School of Physics, Dalian, China;

  Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Chinese Ministry of Education, School of Physics, Dalian, China;

  Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Chinese Ministry of Education, School of Physics, Dalian, China;

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• 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  speckle interferometry; dual-wavelength; topography measurement; multistep phase-shifting; tokamak;

  机译：斑点干涉法双波长地形测量;多步相移托卡马克;