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首页> 外文期刊>Optical engineering >Using phase of second-harmonic interference fringes as a position marker for detecting the zero optical path difference in a nonlinear pulse-train interferometer
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Using phase of second-harmonic interference fringes as a position marker for detecting the zero optical path difference in a nonlinear pulse-train interferometer

机译：使用二次谐波干涉条纹的相位作为位置标记来检测非线性脉冲串干涉仪中的零光程差

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摘要

The possibility of using the phase of second-harmonic interference fringes as a position marker for detecting the zero optical path difference (OPD) in a nonlinear pulse-train interferometer is investigated. A theoretical analysis showed that the phase of second-harmonic fringes can be used as a position marker for detecting the zero OPD, and compared to the phase of the fundamental wave, it provides a higher coefficient of sensitivity to the change in distance. In a nonlinear pulse-train interferometer, the phases of the fundamental and second-harmonic fringes were measured, and the positions of their zero-crossing points near the fringe envelope peak were compared. A difference between these two positions and the effectiveness of the proposed method were confirmed. The concept and analysis reported herein pave the way for the development of higher-accuracy, absolute distance measurements.
机译：研究了在非线性脉冲串干涉仪中使用二次谐波干涉条纹的相位作为位置标记来检测零光程差（OPD）的可能性。理论分析表明，二次谐波条纹的相位可以用作检测零OPD的位置标记，并且与基波的相位相比，它对距离变化的灵敏度更高。在非线性脉冲串干涉仪中，测量了基波和二次谐波条纹的相位，并比较了它们在条纹包络峰附近的零交叉点的位置。证实了这两个位置之间的差异以及所提出方法的有效性。本文报道的概念和分析为开发高精度绝对距离测量铺平了道路。

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