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Vision system for surface roughness and surface defect measurement

机译:表面粗糙度和表面缺陷测量的视觉系统

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摘要

A vision system for surface roughness and surface defect measurement is introduced. This system applies two cameras for capturing the laser pattern and scattering images simultaneously. Three features are extracted from the scattering images to characterize the surface roughness. The light pattern images are processed to locate the defect and compute the size of the defect. Some experiments have been performed, and the experimental results verify the feasibility of the method.
机译:介绍了表面粗糙度和表面缺陷测量的视觉系统。该系统适用于同时捕获激光图案和散射图像的两个相机。从散射图像中提取三个特征以表征表面粗糙度。将光图案图像处理以定位缺陷并计算缺陷的尺寸。已经进行了一些实验,实验结果验证了该方法的可行性。

著录项

  • 来源
    《Optical engineering》 |2019年第6期|064103.1-064103.5|共5页
  • 作者

    Ruipeng Guo; Dongliang Bian;

  • 作者单位

    Nanjing University of Aeronautics and Astronautics College of Automation Engineering Nanjing China;

    Nanjing University of Aeronautics and Astronautics College of Automation Engineering Nanjing China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    optical measurement; surface roughness; surface defect; light scattering;

    机译:光学测量;表面粗糙度;表面缺陷;光散射;

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