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Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

机译:通过具有相关的随机粗糙边界的单层和双层的光谱反射法进行光学分析

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摘要

Optical analysis of rough single and double layers is performed by interpreting the spectral dependences of the measured coherent reflectance. Formulas for the coherent reflectance of these systems derived within the scalar theory of diffraction of light are used for this interpretation. Possibilities and limitations of the method utilized are illustrated using several concrete samples of both the rough single and double layers represented by models corresponding to fully correlated (identical), partially correlated, and fully uncorrelated boundaries. It is shown that the values of the optical parameters, the root-mean-square (rms) values of the heights of the boundary irregularities and the values of the cross-correlation coefficients of the boundaries characterizing the layered systems mentioned can be determined within the method described.
机译:粗糙的单层和双层的光学分析是通过解释测得的相干反射率的光谱依赖性来进行的。这些系统的相干反射率公式是在光的标量衍射理论中得出的。使用由对应于完全相关(相同),部分相关和完全不相关的边界的模型表示的粗糙单层和双层的几个具体样本,说明了所使用方法的可能性和局限性。结果表明,可以确定光学参数的值,边界不规则高度的均方根(rms)值以及表征所述分层系统的边界的互相关系数的值。方法介绍。

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