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Influence of the finite aperture and observation of higher longitudinal-order fringes in Fizeau interferometry

机译:有限孔径的影响以及菲索干涉测量中较高阶的纵向条纹的观测

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摘要

The interference pattern of a Fizeau interferometer, ideally a (nearly) self-imaging field, is examined under true measurement conditions. The quality of the higher longitudinal-order fringes is investigated by finite-aperture diffractive calculations. A specific symmetry property of the volume interference pattern, namely the invariance of the intensity structure under a rotation of the interferential wedge about its apex, is studied by nondiffractive simulations that take into account the instrument geometry and finite incident wave. The formation of the higher longitudinal-order fringes is verified experimentally. The possibility of transferring these fringes close to the device by a suitable non-normal incidence is demonstrated. The existence of various fractional Talbot planes is also confirmed.
机译:Fizeau干涉仪的干涉图样(理想情况下是一个(几乎)自成像场)是在真实的测量条件下检查的。通过有限孔衍射计算研究了较高纵向条纹的质量。通过考虑仪器几何形状和有限入射波的非衍射模拟,研究了体积干涉图案的特定对称特性,即在干涉楔围绕其顶点旋转时强度结构的不变性。实验证实了较高的纵向条纹的形成。通过适当的非垂直入射,证明了将这些条纹转移到设备附近的可能性。还证实了各种分数Talbot平面的存在。

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