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Application of two-dimensional wavelet transform in the modulation measurement profilometry

机译:二维小波变换在调制测量轮廓图中的应用

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The vertical optical measurement method with coaxial projection and imaging can measure the com-plex surface or step-like surface because it helps to avoid the shadow and occlusion. Instead of the phase cal-culation and phase unwrapping processing, only the modulation information is needed to reconstruct the surface of the tested object by this method. To improve the accuracy of the modulation calculation at each scanning position from only one fringe pattern, this paper introduces the two-dimensional (2-D) wavelet transform into modulation measurement profilometry. The relationship between the 2-D complex wavelet transform coefficients and the modulation distribution of the fringe is deduced. The computer simulation and experiment are carried out to verify that the method based on the 2-D complex wavelet analysis offers higher accuracy than that based on the Fourier transform analysis.
机译:具有同轴投影和成像功能的垂直光学测量方法可以测量复杂表面或阶梯状表面,因为它有助于避免阴影和遮挡。代替相位计算和相位展开处理,通过这种方法仅需要调制信息即可重建被测物体的表面。为了提高仅一个条纹图案在每个扫描位置的调制计算的准确性,本文将二维(2-D)小波变换引入到调制测量轮廓图中。推导了二维复小波变换系数与条纹调制分布之间的关系。通过计算机仿真和实验,验证了基于二维复小波分析的方法比基于傅立叶变换分析的方法具有更高的准确性。

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