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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns inelectronic speckle pattern interferometry

机译:电子散斑图干涉法中仅使用两个散斑图提高空间条纹分析方法的测量精度

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摘要

High-resolution deformation measurement method, which requires only two speckle patterns in electronic speckle pattern interferometry, is proposed by using fringe analysis based on specklegram. In fringe analysis using the proposed optical system, a pair of real- and imaginary-part components concerning the deformation information is extracted from one speckle pattern by Fourier transform in the same manner as the off-axis digital holography processing. A specklegram is calculated as a fringe image by multiplying the components of the real and imaginary part of speckle patterns in order to perform a high-resolution deformation analysis. Then, the phase map concerning deformation is detected from the specklegram, and the influence of speckle noise is also reduced by shifting the component on frequency domain. Furthermore, the amplitude of the intensity distribution of speckle pattern is normalized in order to reduce the influence by speckle noise much more. It is confirmed that the accuracy of the deformation measurement is efficiently improved by the proposed noise reduction methods.
机译:通过基于斑点图的条纹分析,提出了一种在电子斑点图干涉法中仅需要两个斑点图样的高分辨率变形测量方法。在使用提出的光学系统进行条纹分析时,与离轴数字全息处理相同,通过傅立叶变换从一个散斑图案中提取与变形信息有关的一对实部和虚部分量。通过将斑点图案的实部和虚部的分量相乘,可以将斑点图计算为条纹图像,从而执行高分辨率的变形分析。然后,从散斑图中检测出与变形有关的相位图,并且通过在频域上移动分量来减少散斑噪声的影响。此外,对斑点图案的强度分布的幅度进行归一化,以进一步减少斑点噪声的影响。证实了通过所提出的降噪方法有效地提高了变形测量的精度。

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