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首页> 外文期刊>Optical engineering >Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts
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Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts

机译：通过快速傅立叶变换谐波伪像提高频谱域低相干干涉测量法中的轴向分辨率

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摘要

Low-coherence interferometric setups in the Fourier domain can experience false structures after the Fourier transform procedure due to signal saturation; in fact, these structures are located at multiple frequencies of the original signal, also referred to as harmonics. This study aids in a better understanding of this phenomenon. The aim of the present work was to show that these features can be used to improve differential axial resolution in highly reflective samples. Using an optical coherence tomography system and calibrated step height standards, it was possible to achieve a resolution greater than the light source coherence length.
机译：傅立叶域中的低相干干涉测量设置在傅立叶变换过程之后会由于信号饱和而经历错误的结构。实际上，这些结构位于原始信号的多个频率处，也称为谐波。这项研究有助于更好地了解这种现象。本工作的目的是表明这些功能可用于提高高反射率样品中的差分轴向分辨率。使用光学相干断层扫描系统和校准的台阶高度标准，可以实现大于光源相干长度的分辨率。

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  • 来源
    《Optical engineering》 |2014年第7期|073106.1-073106.11|共11页
  • 作者

    Marcus Paulo Raele; Luiz Vicente Gomes Tarelho; Carlos Leonardo da Silva Azeredo; Iakyra Borrakuens Couceiro; Anderson Zanardi Freitas;

  • 作者单位

    Nuclear and Energy Research Institute, IPEN-CNEN/SP, Av. Prof. Lineu Prestes, 2242, Sao Paulo, SP, CEP 05508-900, Brazil;

    National Institute of Metrology, Quality and Technology-INMETRO, Av. N. Sra. Das Gracas, 50, Duque de Caxias, RJ, CEP 25250-020, Brazil;

    National Institute of Metrology, Quality and Technology-INMETRO, Av. N. Sra. Das Gracas, 50, Duque de Caxias, RJ, CEP 25250-020, Brazil;

    National Institute of Metrology, Quality and Technology-INMETRO, Av. N. Sra. Das Gracas, 50, Duque de Caxias, RJ, CEP 25250-020, Brazil;

    Nuclear and Energy Research Institute, IPEN-CNEN/SP, Av. Prof. Lineu Prestes, 2242, Sao Paulo, SP, CEP 05508-900, Brazil;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    interferometry; Fourier transforms; tomography; imaging; metrology;

    机译：干涉测量傅立叶变换;断层扫描成像计量学;

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