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首页> 外文期刊>Optical engineering >Surface roughness extraction based on Markov random field model in wavelet feature domain
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Surface roughness extraction based on Markov random field model in wavelet feature domain

机译：小波特征域中基于马尔可夫随机场模型的表面粗糙度提取

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摘要

Based on the computer texture analysis method, a new noncontact surface roughness measurement technique is proposed. The method is inspired by the nonredundant directional selectivity and highly discriminative nature of the wavelet representation and the capability of the Markov random field (MRF) model to capture statistical regularities. Surface roughness information contained in the texture features may be extracted based on an MRF stochastic model of textures in the wavelet feature domain. The model captures significant intrascale and interscale statistical dependencies between wavelet coefficients. To investigate the relationship between the texture features and surface roughness R_a, a simple research setup, which consists of a charge-coupled diode camera without a lens and a diode laser, was established, and the laser speckle texture patterns are acquired from some standard grinding surfaces. The research results have illustrated that surface roughness R_a has a good monotonic relationship with the texture features of the laser speckle pattern. If this measuring system is calibrated with the surface standard samples roughness beforehand, the surface roughness actual value R_a can be deduced in the case of the same material surfaces ground at the same manufacture conditions.
机译：基于计算机纹理分析方法，提出了一种新的非接触表面粗糙度测量技术。该方法的灵感来自于小波表示的非冗余方向选择性和高度区分性以及马尔可夫随机场（MRF）模型捕获统计规律性的能力。可以基于小波特征域中的纹理的MRF随机模型来提取包含在纹理特征中的表面粗糙度信息。该模型捕获小波系数之间重要的标度内和标度间统计依存关系。为了研究纹理特征与表面粗糙度R_a之间的关系，建立了一个简单的研究装置，该装置由不带透镜的电荷耦合二极管照相机和二极管激光器组成，并通过一些标准研磨获得了激光斑点纹理图案表面。研究结果表明，表面粗糙度R_a与激光散斑图案的纹理特征具有良好的单调关系。如果该测量系统预先用表面标准样品的粗糙度进行校准，则在相同的材料表面，相同的制造条件下磨削的情况下，可以推导出表面粗糙度的实际值R_a。

著录项

  • 来源
    《Optical engineering》 |2014年第12期|122414.1-122414.7|共7页
  • 作者

    Lei Yang; Li-qiao Lei;

  • 作者单位

    Hefei University of Technology, School of Instrument Science and Opto-electronics Engineering, 193 Tunxi Road, Hefei, 230009 China;

    Hefei University of Technology, School of Instrument Science and Opto-electronics Engineering, 193 Tunxi Road, Hefei, 230009 China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    surface roughness; laser speckle pattern; texture feature; Markov random field; wavelet transform;

    机译：表面粗糙度;激光斑点图案纹理特征;马尔可夫随机场小波变换;

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