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Birefringence measurement using a confocal setup with a pair of birefringent lenses

机译:使用共焦装置和一对双折射透镜进行双折射测量

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摘要

A confocal microscopic setup with a pair of birefringent lenses having their crystal axes crossed is used to measure birefringence of thin samples. The method can be used to measure phase down to the order of λ/10. The fast and slow axes of the object also can be identified. The principle of the method along with the experimental setup is described. Some first-order experimental results are also presented.
机译:具有一对晶轴交叉的双折射透镜的共焦显微装置用于测量薄样品的双折射。该方法可用于测量相位下降到λ/ 10数量级。还可以识别对象的快轴和慢轴。描述了该方法的原理以及实验装置。还提供了一些一阶实验结果。

著录项

  • 来源
    《Optical engineering》 |2008年第3期|033604.1-033604.5|共5页
  • 作者单位

    Department of Applied Optics and Photonics University of Calcutta 92, Acharya Prafulla Chandra Road Calcutta 700009, India;

    Department of Applied Optics and Photonics University of Calcutta 92, Acharya Prafulla Chandra Road Calcutta 700009, India;

    Department of Applied Optics and Photonics University of Calcutta 92, Acharya Prafulla Chandra Road Calcutta 700009, India;

    Department of Applied Optics and Photonics University of Calcutta 92, Acharya Prafulla Chandra Road Calcutta 700009, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    confocal microscopy; birefringence; phase retardation; phase measurement;

    机译:共聚焦显微镜双折射相位延迟相位测量;

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