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A practical approach for optical characterization of a film coated on the optical fiber

机译：表征涂覆在光纤上的薄膜的光学方法的实用方法

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Phase Diffraction (PD)(1) which is a result of the interaction of light waves with a transparent object, is exploited to characterize precisely optical properties of dielectric films coated on the optical fiber without harming any feature of the sample. Typical fiber sensor applications require films coated on the side surface of the optical fiber and optical properties of that curved films are crucial for design purposes. In this study, three Polyvinyl Alcohol (PVA) films are prepared, their thicknesses are estimated based on the phase diffraction method by fitting experimental results with a mathematical model within 2.3% error. The outcomes of this practical method show good agreement with findings of the destructive Scanning Electron Microscopy (SEM) measurements. The method has the potential to allow real time monitoring abrupt changes of surrounding medium's properties and to examine coating quality (i.e. thickness uniformity) of the film. (C) 2017 Elsevier Inc. All rights reserved.
机译：相衍射（PD）（1）是光波与透明物体相互作用的结果，可用于精确表征涂覆在光纤上的介电膜的光学特性，而不会损害样品的任何特征。典型的光纤传感器应用需要在光纤的侧面上涂膜，而弯曲膜的光学特性对于设计而言至关重要。在这项研究中，准备了三层聚乙烯醇（PVA）膜，根据相衍射方法通过将实验结果与误差在2.3％以内的数学模型进行拟合来估计其厚度。这种实用方法的结果与破坏性扫描电子显微镜（SEM）测量结果显示出很好的一致性。该方法具有允许实时监测周围介质性质的突然变化并检查膜的涂层质量（即厚度均匀性）的潜力。 （C）2017 Elsevier Inc.保留所有权利。

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