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Passive optical limiting studies of nanostructured Cu doped ZnO-PVA composite thin films

机译：纳米结构Cu掺杂ZnO-PVA复合薄膜的无源光学极限研究

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摘要

We prepared undoped and Cu doped ZnO semiconducting nanoparticles (NPs) by chemical co-precipitation method and obtained Cu doped ZnO-polyvinyl alcohol (PVA) nanocomposite thin films by spin coating to investigate third order nonlinear optical and optical limiting properties under cw laser excitation. Powder samples of NPs were characterized by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), energy dispersive spectroscopy, transmission electron microscopy, ultra-violet-visible (UV-vis) and Fourier transform infrared spectroscopy. XRD pattern and FE-SEM micrograph revealed the presence of hexagonal wurtzite phase ZnO NPs having uniform morphology with average particle size of 20 nm. The presence of excitons and absorption peaks in the range 343-360 nm, revealed by UV-vis study, were attributed to excitons in n = 1 quantum state. Third order NLO properties of all composite thin films were investigated by He-Ne continuous wave (cw) laser of wavelength 632.8 nm using Z-scan technique. Thermally stimulated enhanced values of nonlinear refraction and absorption coefficients were obtained which may be attributed to self-defocusing effect, reverse saturable absorption, weak free carrier absorption and surface states properties originated from thermo optic effect. Optical limiting properties have been studied using cw diode laser of wavelength 808 nm and results are presented. (C) 2015 Elsevier B.V. All rights reserved.
机译：我们通过化学共沉淀法制备了未掺杂和掺杂Cu的ZnO半导体纳米颗粒（NPs），并通过旋涂获得了掺杂Cu的ZnO-聚乙烯醇（PVA）纳米复合薄膜，以研究连续激光激发下的三阶非线性光学和光学极限性质。 NP的粉末样品通过X射线衍射（XRD），场发射扫描电子显微镜（FE-SEM），能量色散光谱，透射电子显微镜，紫外可见（UV-vis）和傅里叶变换红外光谱进行了表征。 XRD图谱和FE-SEM显微照片显示存在六方纤锌矿相ZnO NP，它们具有均匀的形态，平均粒径为20 nm。紫外可见研究表明，激子和吸收峰在343-360 nm范围内的存在归因于处于n = 1量子态的激子。使用Z扫描技术，通过波长为632.8 nm的He-Ne连续波（cw）激光器研究了所有复合薄膜的三阶NLO性能。获得了热激发的非线性折射系数和吸收系数的增强值，这可能归因于自散焦效应，反向饱和吸收，弱自由载流子吸收以及源自热光学效应的表面态性质。使用波长为808 nm的连续二极管激光器研究了光限制特性，并给出了结果。 （C）2015 Elsevier B.V.保留所有权利。

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