Band gap determination in thick films from reflectance measurements

Vipin Kumar; Sachin Kr; Sharma

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Band gap determination in thick films from reflectance measurements

机译：根据反射率测量确定厚膜中的带隙

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摘要

Spectroscopic techniques are very useful for characterising semiconducting materials. We demonstrate here a new formulation and method for measuring the energy band gap in thick films from the reflectance data.

机译：光谱技术对于表征半导体材料非常有用。我们在这里展示了一种新的配方和方法，可以根据反射率数据测量厚膜的能带隙。

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来源
《Optical Materials》 |1999年第1期|p.115-119|共5页
作者
Vipin Kumar; Sachin Kr; Sharma;
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作者单位

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类工程材料学;
关键词
Band gap; Screen printing; Reflection spectra; Semiconductors;

机译：带隙丝网印刷;反射光谱;半导体类;

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4. Band Gap Measurement of the Sintered Cd_xSe_(1-x) Films from Reflectance Measurement [C] . S. K. Sharma, V. Kumar, S. K. Kaushish, Intl. conference and intensive tutorial course on semiconductor materials and technology . 1997

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Band gap determination in thick films from reflectance measurements

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