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首页> 外文期刊>Optical Review >Measurement of Wavelength Dependence of Electro-Optic Coefficients r 22 of Non-doped and 5% MgO-doped Congruent LiNbO3 Crystals and 1.8% MgO-doped Quasi-stoichiometric LiNbO3 Crystal by Multiple Reflection Interference Method
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Measurement of Wavelength Dependence of Electro-Optic Coefficients r 22 of Non-doped and 5% MgO-doped Congruent LiNbO3 Crystals and 1.8% MgO-doped Quasi-stoichiometric LiNbO3 Crystal by Multiple Reflection Interference Method

机译：多次反射法测量非掺杂5％MgO掺杂LiNbO3 晶体和1.8％MgO准化学计量LiNbO3 晶体的电光系数r 22 的波长依赖性干扰法

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摘要

The electro-optic coefficient r 22 in the wavelength range from 409 to 1580 nm was measured for non-doped and 5% MgO-doped congruent LiNbO3 crystals and 1.8% MgO-doped quasi-stoichiometric LiNbO3 crystals in a simple optical system using a multiple reflection interference method capable of producing high-precision results without the application of antireflection film to the end faces of the crystal. The influence of the manufacturing errors of the electrooptic crystals was discussed on the measurement of the r 22 coefficient. The experimental errors are less than approximately 0.5% in the wavelength range from 409 to 1064 nm and approximately 1% from 1340 to 1580 nm. It was further shown that polarizing of the laser along X axis resulted in highly accurate measurement of the r 22 of LiNbO3 crystals.
机译：对于非掺杂和5％MgO掺杂的全LiNbO3 晶体和1.8％MgO掺杂的准化学计量LiNbO3 <在使用多反射干涉法的简单光学系统中的晶体，能够在不将抗反射膜施加到晶体端面的情况下产生高精度结果。讨论了电光晶体制造误差对r 22 系数测量的影响。在409至1064 nm的波长范围内，实验误差小于约0.5％，而在1340至1580 nm的波长范围内，实验误差小于1％。进一步表明，激光在X轴上的偏振导致LiNbO3 晶体的r 22 的高精度测量。

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