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首页> 外文期刊>Optics and Lasers in Engineering >Thermoreflectance Imaging Of Laser Diodes And Vcsels Along And Perpendicular To The Emission Direction
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Thermoreflectance Imaging Of Laser Diodes And Vcsels Along And Perpendicular To The Emission Direction

机译:激光二极管和容器沿发射方向并垂直于发射方向的热反射成像

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摘要

Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes: classical ridge laser diodes and vertical cavity surface emitting lasers (VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then, we tried to determine the inner temperature of the VCSELs.
机译:半导体激光器的热特性是光电子学的重要问题。本文介绍了我们在两种不同类型的激光二极管上的热反射率测量结果:经典的脊形激光二极管和垂直腔表面发射激光器(VCSEL)。我们首先研究了脊形二极管的外部温度升高,以确定不均匀性。然后,我们尝试确定VCSEL的内部温度。

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