Full-field Measurement Of The Phase Retardation For Birefringent Elements By Using Common Path Heterodyne Interferometry

Yen-Liang Chen; Der-Chin Su

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Full-field Measurement Of The Phase Retardation For Birefringent Elements By Using Common Path Heterodyne Interferometry

机译：使用共通路径外差干涉法对双折射元件的相位延迟进行全场测量

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摘要

A collimated heterodyne light passes through the tested material and an analyzer, full-field interference signals are taken by a fast CMOS camera. The series of interference intensities recorded at any pixel are the sampling points of a sinusoidal signal. From those points, the associated argument of that pixel can be derived by a least-square sine fitting algorithm on IEEE 1241 Standards. Subtracting the average argument of the reference signal, the phase retardation of that pixel can be obtained. The phase retardations of other pixels can be obtained similarly. Its validity is demonstrated.

机译：准直的外差光穿过被测材料和分析仪，全场干扰信号由快速CMOS相机拍摄。在任何像素处记录的一系列干扰强度是正弦信号的采样点。从这些点可以通过IEEE 1241标准上的最小二乘正弦拟合算法来推导该像素的关联参数。减去参考信号的平均自变量，可以获得该像素的相位延迟。可以类似地获得其他像素的相位延迟。证明了其有效性。

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来源
《Optics and Lasers in Engineering》 |2009年第4期|p.484-487|共4页
作者
Yen-Liang Chen; Der-Chin Su;
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作者单位

Department of Photonics, Institute of Electro-Optical Engineering, National Chiao-Tung University, 1001 Ta-Hsueh Road, Hsinchu 300, Taiwan;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类光学;
关键词
electro-optic modulation; phase retardation; heterodyne interferometry; common-path interferometry;

机译：电光调制;相位延迟;外差干涉法;共径干涉法;

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Full-field Measurement Of The Phase Retardation For Birefringent Elements By Using Common Path Heterodyne Interferometry

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