Optical characterization of GaN microcavity fabricated by wet etching

著录项

• 来源
  《Physica Status Solidi. C, Conferences and critical reviews》 |2006年第6期|p.2019-2021|共3页
• 作者

  C.-Y. Lu; S.-L. Wang; H.-M. Wu; L.-H. Peng;

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• 作者单位

  Graduate Institute of Electro-Optical Engineering, and Department of Electrical Engineering, National Taiwan University, Taipei, 106, R.O.C.;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类 固体物理学;
• 关键词

  scanning electron microscopy (SEM) (including EBIC); structure and morphology; thickness; crystalline orientation and texture; Ⅲ-Ⅴ semiconductors; Ⅲ-Ⅴ semiconductors; semiconductor materials in electrochemistry;

  机译：扫描电子显微镜（SEM）（包括EBIC）;结构和形态;厚度;晶体取向和织构;Ⅲ-Ⅴ类半导体;Ⅲ-Ⅴ类半导体;电化学中的半导体材料;