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Metallic Phase in Lightly Doped La_(2-x)Sr_xCuO_4 Observed by Electron Paramagnetic Resonance

机译:电子顺磁共振观察轻掺杂La_(2-x)Sr_xCuO_4中的金属相

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摘要

In the low doping range of x from 0.01 to 0.06 in La_(2-x)Sr_xCuO_4, a narrow electron paramagnetic resonance (EPR) line has been investigated This line is distinct from the known broad line and both lines are due to probing Mn~(2+) ions. The narrow line is ascribed to metallic regions in the material, and its intensity increases exponentially upon cooling below ~150 K. The activation energy deduced A = 460(50) K is nearly the same as that found in the doped superconducting regime by Raman and neutron scattering. The intensity of the narrow EPR line follows the same temperature dependence as the in-plane resistivity anisotropy in lightly doped La_(2-x)Sr_xCuO_4 single crystals.
机译:在La_(2-x)Sr_xCuO_4中从0.01到0.06的x的低掺杂范围内,研究了一条窄的电子顺磁共振(EPR)谱线。该谱线与已知的宽谱线不同,两条谱线均是由于探测Mn〜 (2+)个离子。窄线归因于材料中的金属区域,冷却至〜150 K以下时其强度呈指数增加。推论出的活化能A = 460(50)K与拉曼和拉曼在掺杂超导体系中发现的几乎相同。中子散射。 EPR窄线的强度遵循与轻掺杂La_(2-x)Sr_xCuO_4单晶中的面内电阻率各向异性相同的温度依赖性。

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