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Casimir force measurements from silicon carbide surfaces

机译：从碳化硅表面测量卡西米尔力

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摘要

Using an atomic force microscope we performed measurements of the Casimir force between a gold- coated (Au) microsphere and doped silicon carbide (SiC) samples. The last of these is a promising material for devices operating under severe environments. The roughness of the interacting surfaces was measured to obtain information for the minimum separation distance upon contact. Ellipsometry data for both systems were used to extract optical properties needed for the calculation of the Casimir force via the Lifshitz theory and for comparison to the experiment. Special attention is devoted to the separation of the electrostatic contribution to the measured total force. Our measurements demonstrate large contact potential V_0 (≈0.67 V), and a relatively small density of charges trapped in SiC. Knowledge of both Casimir and electrostatic forces between interacting materials is not only important from the fundamental point of view, but also for device applications involving actuating components at separations of less than 200 nm where surface forces play dominant role.
机译：我们使用原子力显微镜对镀金（Au）微球和掺杂碳化硅（SiC）样品之间的卡西米尔力进行了测量。这些中的最后一个是在恶劣环境下运行的设备的有希望的材料。测量相互作用表面的粗糙度以获得接触时最小间隔距离的信息。两种系统的椭偏数据均用于提取通过Lifshitz理论计算卡西米尔力所需的光学性质，并与实验进行比较。特别注意静电对测量总力的影响的分离。我们的测量结果表明，接触电势V_0较大（≈0.67V），并且SiC中捕获的电荷密度相对较小。对于卡西米尔和相互作用材料之间的静电力的了解，不仅从基本的观点出发，而且对于涉及间距小于200 nm的致动组件的器件应用也很重要，其中表面力起主要作用。

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  • 来源
    《Physical review》 |2016年第8期|085434.1-085434.6|共6页
  • 作者

    M. Sedighi; V. B. Svetovoy; G. Palasantzas;

  • 作者单位

    Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands;

    MESA+ Institute for Nanotechnology, University of Twente, P. O. 217, 7500 AE Enschede, The Netherlands,Institute of Physics and Technology, Yaroslavl Branch, 150007, Universitetskaya 21, Yaroslavl, Russia;

    Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands;

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