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Thickness and electric-field-dependent polarizability and dielectric constant in phosphorene

机译:磷中厚度和电场相关的极化率和介电常数

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摘要

Based on extensive first-principles calculations, we explore the thickness-dependent effective dielectric constant and slab polarizability of few-layer black phosphorene. We find that the dielectric constant in ultrathin phosphorene is thickness-dependent and it can be further tuned by applying an out-of-plane electric field. The decreasing dielectric constant with reducing number of layers of phosphorene is a direct consequence of the lower permittivity of the outer layers and the increasing surface-to-volume ratio. We also show that the slab polarizability depends linearly on the number of layers, implying a nearly constant polarizability per phosphorus atom. Our calculation of the thickness- and electric-field-dependent dielectric properties will be useful for designing and interpreting transport experiments in gated phosphorene devices, wherever electrostatic effects such as capacitance and charge screening are important.
机译:基于大量的第一性原理计算,我们探索了取决于厚度的有效层介电常数和几层黑色磷光片的平板极化率。我们发现,超薄磷烯中的介电常数与厚度有关,可以通过施加平面外电场对其进行进一步调节。随着磷光体层数的减少,介电常数的降低是外层介电常数降低和表面积/体积比增加的直接结果。我们还表明,平板的极化率线性依赖于层数,这意味着每个磷原子的极化率几乎恒定。无论静电容量(例如电容和电荷屏蔽)如何重要,只要我们对厚度和电场相关的介电性能进行计算,将对设计和解释门控磷光器件中的传输实验非常有用。

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  • 来源
    《Physical review》 |2016年第19期|195428.1-195428.8|共8页
  • 作者单位

    Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, India;

    Department of Physics, Bundelkhand University, Jhansi 284128, India;

    Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208016, India;

    Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, India;

    Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, India;

    Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208016, India;

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