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首页> 外文期刊>Physical review >Manipulation of subsurface carbon nanoparticles in Bi_2Sr_2CaCu_2O_(8+δ) using a scanning tunneling microscope
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Manipulation of subsurface carbon nanoparticles in Bi_2Sr_2CaCu_2O_(8+δ) using a scanning tunneling microscope

机译:使用扫描隧道显微镜操作Bi_2Sr_2CaCu_2O_(8 +δ)中的地下碳纳米颗粒

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摘要

We present evidence that subsurface carbon nanoparticles in Bi_2Sr_2CaCu_2O_(8+δ) can be manipulated with nanometer precision using a scanning tunneling microscope. High-resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.
机译:我们提供的证据表明,可以使用扫描隧道显微镜以纳米精度操纵Bi_2Sr_2CaCu_2O_(8 +δ)中的地下碳纳米颗粒。高分辨率图像表明,大多数碳颗粒在运输后仍保留在地下,因为随着颗粒在表面上的升高,其高度会局部增加。这些突起附近的隧道光谱显示出半导体特性,带隙约为1.8 eV,表明碳的引入会局部改变表面附近的电子性能。

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