Topography of the graphene/Ir(111) moire studied by surface x-ray diffraction

Fabien Jean; Tao Zhou; Nils Blanc; Roberto Felici; Johann Coraux; Gilles Renaud

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Topography of the graphene/Ir(111) moire studied by surface x-ray diffraction

机译：表面X射线衍射研究石墨烯/ Ir（111）波纹的形貌

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The structure of a graphene monolayer on Ir(111) has been investigated in situ in the growth chamber by surface x-ray diffraction including the specular rod, which allows disentangling the effect of the sample roughness from that of the nanorippling of graphene and iridium along the moire-like pattern between graphene and Ir(111). Accordingly, we are able to provide precise estimates of the undulation associated with this nanorippling, which is small in this weakly interacting graphene-metal system and thus has proved difficult to assess in the past. The nanoripplings of graphene and iridium are found in phase, i.e., the in-plane positions of their height maxima coincide, but the amplitude of the height modulation is much larger for graphene (0.379 ± 0.044 A) than, e.g., for the topmost Ir layer (0.017 ± 0.002 A). The average graphene-Ir distance is found to be 3.38 ± 0.04 A.

机译：Ir（111）上石墨烯单层的结构已通过包括镜面棒的表面x射线衍射在生长室中进行了原位研究，这可以使样品粗糙度的影响与石墨烯和铱的纳米波纹沿着石墨烯与Ir（111）之间的波纹状图案。因此，我们能够提供与这种纳米波纹相关的起伏的精确估计，这种波动在这种弱相互作用的石墨烯-金属系统中很小，因此过去很难评估。发现石墨烯和铱的纳米波纹是同相的，即它们的高度最大值的面内位置重合，但是石墨烯的高度调制幅度（0.379±0.044 A）比例如最高的Ir大得多层（0.017±0.002 A）。发现平均石墨烯-Ir距离为3.38±0.04 A.

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《Physical review》 |2015年第24期|245424.1-245424.6|共6页
作者
Fabien Jean; Tao Zhou; Nils Blanc; Roberto Felici; Johann Coraux; Gilles Renaud;
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Univ. Grenoble Alpes, F-38000 Grenoble, France ,CNRS, Inst NEEL, F-38042 Grenoble, France;

Univ. Grenoble Alpes, F-38000 Grenoble, France ,CEA, INAC-SP2M, Grenoble, F-38054, France;

Univ. Grenoble Alpes, F-38000 Grenoble, France ,CNRS, Inst NEEL, F-38042 Grenoble, France;

European Synchrotron Radiation Facility, Boite Postale 220, F-38043 Grenoble Cedex 9, France;

Univ. Grenoble Alpes, F-38000 Grenoble, France ,CNRS, Inst NEEL, F-38042 Grenoble, France;

Univ. Grenoble Alpes, F-38000 Grenoble, France ,CEA, INAC-SP2M, Grenoble, F-38054, France;

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1. Clusters binding to the graphene moire on Ir(111): X-ray photoemission compared to density functional calculations [J] . Jan Knudsen, Peter J. Feibelman, Timm Gerber, Physical review . 2012,第3期

机译：与Ir（111）上的石墨烯波纹结合的簇：与密度泛函计算相比的X射线光发射
2. Electrochemical Au deposition on stepped Si(111)-H surfaces: 3D versus 2D growth studied by AFM and X-ray diffraction [J] . S. Warren, P. Prodhomme, F. Maroun, Surface Science . 2009,第9期

机译：在阶梯状Si（111）-H表面上的电化学金沉积：通过AFM和X射线衍射研究3D与2D生长
3. Monomer Structures of Water Adsorbed on p(2 X 2)-Ni(111)-O Surface at 25 and 140 K Studied by Surface X-Ray Diffraction [J] . Masashi Nakamura, Masatoki Ito Physical review letters . 2005,第3期

机译：表面X射线衍射研究25和140 K时p（2 X 2）-Ni（111）-O表面吸附的水的单体结构
4. Laser-Induced Transient Structural Changes in Ag(111) Studied by Time Resolved X-ray Diffraction [C] . Ali Oguz Er, Jie Chen, Peter M. Rentzepis Materials Research Society Symposium on Defects and Microstructure Complexity in Materials . 2013

机译：通过时间分辨X射线衍射研究的AG（111）激光诱导的瞬态结构变化
5. The growth of epitaxial iron oxides on platinum (111) as studied by x-ray photoelectron diffraction, scanning tunneling microscopy, and low-energy electron diffraction. [D] . Kim, Yong-Joo. 1995

机译：通过X射线光电子衍射，扫描隧道显微镜和低能电子衍射研究了外延氧化铁在铂（111）上的生长。
6. Three-dimensional surface topography of graphene by divergent beam electron diffraction [O] . Tatiana Latychevskaia, Wei-Hao Hsu, Wei-Tse Chang, -1

机译：石墨烯的发散电子衍射三维表面形貌
7. Topography of the graphene/Ir(111) moiré studied by surface x-ray diffraction [O] . Jean, Fabien, Zhou, Tao, Blanc, Nils, 2015

机译：表面X射线衍射研究石墨烯/ Ir（111）波纹的形貌
8. Growth of epitaxial iron oxides on platinum (111) as studied by X-ray photoelectron diffraction, scanning tunneling microscopy, and low energy electron diffraction [R] . Kim, Y. J. 1995

机译：通过X射线光电子衍射，扫描隧道显微镜和低能电子衍射研究铂（111）上外延氧化铁的生长

Topography of the graphene/Ir(111) moire studied by surface x-ray diffraction

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