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Energy relaxation times in metal films from the response of electrical conductivity to periodic heating

机译:从导电率到周期性加热的响应,金属膜中的能量弛豫时间

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摘要

Heating of a metal film with a weak oscillating heat source leads to oscillations of the electron temperature T_e. Because of the temperature dependence of phonon contribution to electrical conductivity, the oscillations of T_e result in oscillations of voltage across the current-carrying film. Using the equation for T_e and the expression for the phonon contribution to the electrical conductivity, we have found the connection of the frequency dependence of the amplitude of the voltage oscillations across the film with the time of electron-phonon collisions (τ_e) and the mean phonon escape time from the film to the substrate (τ_(es)). Renormalization of electron-phonon interaction by impurities and defects is considered phenomenologically. It is discussed how the times τ_e and τ_(es) can be found experimentally using the peculiarities of the frequency dependence of the voltage oscillations across the film.
机译:用弱的振荡热源加热金属膜导致电子温度T_e的振荡。由于声子对电导率的贡献与温度有关,所以T_e的振荡会导致载流膜两端的电压振荡。使用T_e的方程式和声子对电导率的贡献的表达式,我们发现了薄膜上电压振荡幅度的频率依赖性与电子-声子碰撞时间(τ_e)以及均值之间的关系。从膜到基底的声子逸出时间(τ_(es))。从杂质学和缺陷上​​重新考虑电子与声子相互作用的归一化。讨论了如何使用跨膜的电压振荡的频率相关性的特性通过实验找到时间τ_e和τ_(es)。

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  • 来源
    《Physical review》 |2014年第21期|214303.1-214303.7|共7页
  • 作者单位

    National Science Center, Kharkov Institute of Physics and Technology, 1 Akademicheskaya Street, 61108 Kharkov, Ukraine;

    National Science Center, Kharkov Institute of Physics and Technology, 1 Akademicheskaya Street, 61108 Kharkov, Ukraine,Kharkov National University, 4 Svobody Square, 61077 Kharkov, Ukraine;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    relaxation times and mean free paths;

    机译:松弛时间和平均自由程;

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