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Extent and feature of lattice distortions around Ga impurity atoms in InSb single crystal

机译:InSb单晶中Ga杂质原子周围晶格畸变的程度和特征

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摘要

To clarify lattice distortions induced by adding Ga atoms in the InSb crystal, Ga Kα x-ray fluorescence holography (XFH) experiments were carried out on an In_(0.995)Ga_(0.005) Sb diluted mixed single crystal, and three-dimensional atomic images around the Ga atoms were reconstructed. Although the atomic images are located almost at ideal positions of the InSb crystal, some differences can be observed for only the first- and second-neighboring atoms. By combining them with x-ray absorption fine structure data, large spatial fluctuations of the first-neighboring atoms appear in the angular direction, which can be clarified from the present XFH results. From the XFH results, it is concluded that lattice distortions are limited within the second neighbors in this diluted mixed crystal, in contrast to five chemical bonds in a heavily doped mixed crystal of Zn_(0.4)Mn_(0.6)Te reported previously.
机译:为了弄清楚在InSb晶体中添加Ga原子引起的晶格畸变,对In_(0.995)Ga_(0.005)Sb稀释的混合单晶进行了GaKαX射线荧光全息(XFH)实验,并获得了三维原子图像围绕Ga原子进行了重建。尽管原子像几乎位于InSb晶体的理想位置,但是仅对于第一个和第二个相邻的原子可以观察到一些差异。通过将它们与X射线吸收精细结构数据结合,可以在角度方向上出现第一相邻原子的较大空间波动,这可以从当前XFH结果中得到澄清。从XFH结果可以得出结论,与先前报道的重掺杂Zn_(0.4)Mn_(0.6)Te混合晶体中的五个化学键不同,该稀释的混合晶体的晶格畸变仅限于第二个邻域内。

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  • 来源
    《Physical review》 |2013年第9期|094104.1-094104.8|共8页
  • 作者单位

    Department of Physics, Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan;

    Graduate School of Information Sciences, Hiroshima City University, Hiroshima 731-3194, Japan;

    Research Center for Condensed Matter Physics, Hiroshima Institute of Technology, Hiroshima 731-5193, Japan;

    Department of Physics, Faculty of Science, University of Toyama, Toyama 930-8555, Japan;

    Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan;

    Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    experimental determination of defects by diffraction and scattering;

    机译:通过衍射和散射实验确定缺陷;

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