首页> 外文期刊>Physical review >Charge transport analysis of poly(3-hexylthiophene) by electroreflectance spectroscopy
【24h】

Charge transport analysis of poly(3-hexylthiophene) by electroreflectance spectroscopy

机译:聚(3-己基噻吩)的电反射光谱分析

获取原文
获取原文并翻译 | 示例
           

摘要

The charge transport in organic semiconductors is still not completely understood. We use electroreflectance spectroscopy to investigate charge transport in organic field effect devices in order to obtain optical information on the charges within the charge accumulation layer at the organic semiconductor-insulator interface. Here, the reflectance geometry allows an analysis of devices prepared on opaque substrates. The recorded spectra were analyzed based on optical layer stack simulations to extract quantitatively the change of the dielectric function due to the charge injection of the accumulation layer in poly(3-hexylthiophene) (P3HT). For the simulation the anisotropic optical response of spin-coated P3HT layers is experimentally determined by spectroscopic ellipsometry. Using the developed theoretical approach the characteristic change of three different preparations of the organic semiconductor-insulator interface is analyzed. Laterally resolved measurements close to an injecting contact have revealed characteristic spectral changes in dependence of the preparation conditions, and significant spectral changes within the first 90 μm from the contact were found, which were attributed to an energetic relaxation of charges during the charge transport process.
机译:尚不完全了解有机半导体中的电荷传输。我们使用电反射光谱法研究有机场效应器件中的电荷传输,以获得有机半导体-绝缘体界面处电荷累积层中电荷的光学信息。在此,反射几何形状允许分析在不透明基板上制备的器件。基于光学层堆叠模拟对记录的光谱进行分析,以定量提取由于聚(3-己基噻吩)(P3HT)中累积层的电荷注入而引起的介电函数变化。为了进行模拟,旋涂的P3HT层的各向异性光学响应是通过光谱椭圆偏振法实验确定的。使用发展的理论方法,分析了有机半导体-绝缘体界面的三种不同制备方法的特性变化。靠近注入触点的横向分辨测量结果已揭示了取决于制备条件的特征光谱变化,并且发现了从接触开始的前90μm内的显着光谱变化,这归因于电荷传输过程中电荷的能量松弛。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号