Monitoring antiferromagnetism via angle-resolved Auger photoelectron coincidence spectroscopy: The case of NiO/Ag(001)

R. Gotter; M. Sbroscia; M. Caminale; S. R. Vaidya; E. Perfetto; R. Moroni; F. Bisio; S. Iacobucci; G. Di Filippo; F. Offi; A. Ruocco; G. Stefani; L. Mattera; M. Cini

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Monitoring antiferromagnetism via angle-resolved Auger photoelectron coincidence spectroscopy: The case of NiO/Ag(001)

机译：通过角度分辨俄歇光电子符合光谱法监测反铁磁性：NiO / Ag（001）的情况

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Spin selectivity in angle-resolved Auger photoelectron coincidence spectroscopy (AR-APECS) is used to probe electronic structure in antiferromagnetic thin films. In particular, exploiting the AR-APECS capability to discriminate Auger electron emission events characterized by a different spin of the ion in its final state, a sharp multiplet structure in the Ni MW Auger line shape of NiO/Ag(001) thin films is measured below the critical Neel temperature. The assignment of multiplet terms follows from a close comparison of the experimental AR-APECS line shapes with the predictions based on semiempirical calculations on a cluster model and an open-band extension of the Cini-Sawatzky approach. In analogy to CoO, also in NiO, above the Neel temperature a more featureless Auger spectrum appears and AR-APECS does not disentangle anymore high-spin and low-spin contributions to the total Auger intensity. Such a behavior, which seems to be a general result for metal oxide antiferromagnetic systems, is discussed.

机译：角度分辨俄歇光电子符合光谱法（AR-APECS）中的自旋选择性用于探测反铁磁薄膜中的电子结构。尤其是，利用AR-APECS的能力来辨别以最终状态下的离子自旋不同为特征的俄歇电子发射事件，可以测量NiO / Ag（001）薄膜的Ni MW俄歇线形中的尖峰多重结构。低于临界Neel温度。多重项的分配来自实验AR-APECS线形与基于聚类模型的半经验计算和Cini-Sawatzky方法的开放频带扩展的预测的紧密比较。与CoO相似，在NiO中，在Neel温度以上，出现了一个更没有特征的俄歇谱，并且AR-APECS不再将高自旋和低自旋对总俄歇强度的贡献解开。讨论了这种行为，这似乎是金属氧化物反铁磁系统的一般结果。

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来源
《Physical review》 |2013年第9期|094403.1-094403.7|共7页
作者
R. Gotter; M. Sbroscia; M. Caminale; S. R. Vaidya; E. Perfetto; R. Moroni; F. Bisio; S. Iacobucci; G. Di Filippo; F. Offi; A. Ruocco; G. Stefani; L. Mattera; M. Cini;
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作者单位

CNR-IOM, Istituto Officina dei Materiali, do Area Science Park, SS 14 Km 163.5,1-34149 Basovizza, Trieste, Italy;

Scuola Dottorale in Matematica e Fisica, Universita degli Studi Roma Tre, Via della Vasca Navale 84,1-00146 Roma, Italy;

Dipartimento di Fisica, Universita degli Studi di Genova, via Dodecaneso 33,1-16146 Genova, Italy;

CNR-IOM, Istituto Officina dei Materiali, do Area Science Park, SS 14 Km 163.5,1-34149 Basovizza, Trieste, Italy,Scuola di Dottorato in Nanotecnologie, Universita degli Studi di Trieste, Piazzale Europa 1,1-34127 Trieste, Italy;

Dipartimento di Fisica, Universita degli Studi di Roma Tor Vergata, Via della Ricerca Scientifica 1,1-00133 Roma, Italy;

CNR-SPIN, Istituto superconduttori, materiali innovativi e dispositivi, Sezione di Genova, Corso Perrone 24,1-16152 Genova, Italy;

CNR-SPIN, Istituto superconduttori, materiali innovativi e dispositivi, Sezione di Genova, Corso Perrone 24,1-16152 Genova, Italy;

CNR-IFN, Istituto Fotonica e Nanotecnologie, clo Dipartimento di Scienze, Universita degli Studi Roma Tre, Via della Vasca Navale 84, 1-00146 Roma, Italy;

Scuola Dottorale in Matematica e Fisica, Universita degli Studi Roma Tre, Via della Vasca Navale 84,1-00146 Roma, Italy;

Dipartimento di Scienze e Unita CNISM, Universita degli Studi Roma Tre, Via della Vasca Navale 84,1-00146 Roma, Italy;

Dipartimento di Scienze e Unita CNISM, Universita degli Studi Roma Tre, Via della Vasca Navale 84,1-00146 Roma, Italy;

Dipartimento di Scienze e Unita CNISM, Universita degli Studi Roma Tre, Via della Vasca Navale 84,1-00146 Roma, Italy;

Dipartimento di Fisica, Universita degli Studi di Genova, via Dodecaneso 33,1-16146 Genova, Italy;

Dipartimento di Fisica, Universita degli Studi di Roma Tor Vergata, Via della Ricerca Scientifica 1,1-00133 Roma, Italy,Laboratori Nazionali di Frascati, Istituto Nazionale di Fisica Nucleare, Via Enrico Fermi 40,1-00044 Frascati, Roma, Italy;

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magnetic properties of thin films, surfaces, and interfaces; electron spectroscopy (X-ray photoelectron (XPS), auger electron spectroscopy (AES), etc.); adsorbed layers and thin films;

机译：薄膜;表面和界面的磁性能;电子光谱（X射线光电子（XPS）;螺旋钻电子光谱（AES）等）;吸附层和薄膜;

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专利

1. M_3m_(45)m_(45) Auger Lineshape Measured From The Cu(111) Surface: Multiplet Term Selectivity In Angle-resolved Auger-photoelectron Coincidence Spectroscopy [J] . R. Gotter, F. Da Pieve, F. Offi, Physical review . 2009,第7期

机译：从Cu（111）表面测量的M_3m_（45）m_（45）俄歇线形：角度分辨俄歇光电子重合谱中的多重项选择性
2. Linear magnetic and alignment dichroism in Auger-photoelectron coincidence spectroscopy [J] . Da Pieve F, Fritzsche S, Stefani G, Journal of Physics, B. Atomic, Molecular and Optical Physics: An Institute of Physics Journal . 2007,第1a2期

机译：俄歇光电子重合谱中的线性磁性和取向二向色性
3. Comparison of the Auger photoelectron coincidence spectroscopy (APECS) spectra of Ag and InP with Cu and GaAs [J] . Thurgate SM, Lund CP Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 1997,第1期

机译：Ag和InP与Cu和GaAs的俄歇光电子符合光谱（APECS）光谱的比较
4. Band structure investigation of chalcopyrite CuInSe_2(001) by angle-resolved photoelectron spectroscopy [C] . Ralf Hunger, Christian Pettenkofer Symposium Proceedings vol.865; Symposium on Thin-Film Compound Semiconductor Photovoltaics; 20050329-0401; San Francisco,CA(US) . 2005

机译：角度分辨光电子能谱研究黄铜矿CuInSe_2（001）的能带结构
5. First measurements of the low energy tail (LET) down to 0 eV using Auger Photoelectron Coincidence Spectroscopy (APECS) in Ag (100) and Cu (100). [D] . Shastry, Karthik. 2010

机译：使用Ag（100）和Cu（100）中的俄歇光电子符合光谱（APECS）对低至0 eV的低能尾巴（LET）进行首次测量。
6. Disentangling Auger decays in O2 by photoelectron-ion coincidences [O] . Xiao-Jing Liu, Christophe Nicolas, Minna Patanen, -1

机译：通过光电子离子巧合解开O2中的俄歇衰变
7. Linear magnetic and alignment dichroism in Auger–photoelectron coincidence spectroscopy [O] . F Da Pieve, S Fritzsche, G Stefani, 2007

机译：俄歇光电子重合光谱中的线性磁性和对准二向色性
8. Photoelectron Spectroscopy Studies of Cr(001) Surface Ferromagnetism and Near-Surface Antiferromagnetism [R] . Klebanoff, L. E. 1985

机译：Cr（001）表面铁磁性和近表面反铁磁性的光电子能谱研究

Monitoring antiferromagnetism via angle-resolved Auger photoelectron coincidence spectroscopy: The case of NiO/Ag(001)

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