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Distinguishing carbon nanotube defect chemistry using scanning gate spectroscopy

机译:使用扫描门光谱法区分碳纳米管缺陷化学

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摘要

Electronic scattering at individual defect sites is presumably sensitive to defect chemistry. Here, we combine advances in carbon nanotube device fabrication and scanning probe characterization to investigate this correspondence. Specifically, we apply scanning gate spectroscopy (SGS) to the study of defects introduced into single walled carbon nanotubes by point functionalization in water, sulfuric acid, or hydrochloric acid. SGS measures the energy-dependent transmission functions of defect sites, and by working in the dilute limit of individual, isolated defects we empirically distinguish the three chemical types. A preliminary analysis proposes a scattering model in order to motivate further theoretical investigations of this one-dimensional scattering system.
机译:推测单个缺陷位点的电子散射对缺陷化学敏感。在这里,我们结合了碳纳米管器件制造和扫描探针表征方面的进展来研究这种对应关系。具体而言,我们将扫描门光谱(SGS)应用于在水,硫酸或盐酸中通过点官能化引入单壁碳纳米管中的缺陷的研究。 SGS测量缺陷部位的能量依赖性传输功能,并通过在稀疏的单个独立缺陷中进行实验来区分三种化学类型。初步分析提出了一种散射模型,以激发对该一维散射系统进行进一步的理论研究。

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