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Quantum dot admittance probed at microwave frequencies with an on-chip resonator

机译:使用片上谐振器在微波频率下探测量子点导纳

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摘要

We present microwave frequency measurements of the dynamic admittance of a quantum dot tunnel-coupled to a two-dimensional electron gas. The measurements are made via a high-quality 6.75 GHz on-chip resonator capacitively coupled to the dot. The resonator frequency is found to shift both down and up close to conductance resonance of the dot corresponding to a change of sign of the reactance of the system from capacitive to inductive. The observations are consistent with a scattering matrix model. The sign of the reactance depends on the detuning of the dot from conductance resonance and on the magnitude of the tunnel rate to the lead with respect to the resonator frequency. Inductive response is observed on a conductance resonance when tunnel coupling and temperature are sufficiently small compared to the resonator frequency.
机译:我们介绍了耦合到二维电子气的量子点隧道的动态导纳的微波频率测量。测量是通过电容性耦合至点的高质量6.75 GHz片上谐振器进行的。发现谐振器频率向下和向上偏移,接近点的电导谐振,这对应于系统电抗的符号从电容性变化到电感性。观察结果与散射矩阵模型一致。电抗的符号取决于点与电导谐振的失谐以及相对于谐振器频率到引线的隧穿速率的大小。当隧道耦合和温度与谐振器频率相比足够小时,在电导谐振上会观察到感应响应。

著录项

  • 来源
    《Physical review》 |2012年第11期|p.115303.1-115303.7|共7页
  • 作者单位

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Department of Physics, ETH Zurich, CH-8093 Zurich, Switzerland;

    Departement de Physique Theorique, Universite de Geneve, 24 quai Ernest Ansermet, CH-1211 Geneve, Switzerland;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    quantum dots; quantum dots; quantum dots; quantum dots;

    机译:量子点;量子点;量子点;量子点;

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