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Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system

机译:外延MnPd / Fe交换偏压系统中磁化反转的反铁磁层厚度依赖性

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摘要

We report an investigation on the antiferromagnetic layer thickness dependence of magnetization reversal in c-axis oriented MnPd/Fe epitaxial exchange biased bilayers. Several kinds of multistep loops were observed for different samples measured at various field orientation. The evolution of the angular dependent magnetic behavior evolving from a representative Fe film to the exchange biased bilayers was revealed. With increase of the thickness of the antiferromagnetic layers, asymmetrically shaped loops and biased two-step loops are induced by exchange bias. Including the unidirectional anisotropy, a model based on the domain nucleation and propagation was developed, which can nicely describe the evolution of the magnetic behaviors for MnPd/Fe bilayers and correctly predicts the critical angles separating the occurrence of different magnetic switching processes. For fields applied along the bias direction, the 180° magnetic reversal changes from two successive 90° domain wall nucleations to a single 180° domain wall nucleation at the critical thickness of the MnPd layer.
机译:我们报告了对在c轴取向MnPd / Fe外延交换偏置双层中磁化反转的反铁磁层厚度依赖性的研究。对于在不同场定向下测量的不同样品,观察到了几种多步循环。揭示了从代表性的Fe膜向交换偏置的双层演化的随角度变化的磁行为。随着反铁磁层厚度的增加,交换偏压引起不对称形状的回路和偏置的两步回路。包括单向各向异性在内,建立了基于畴成核和传播的模型,该模型可以很好地描述MnPd / Fe双层磁行为的演变,并正确预测分离不同磁开关过程发生的临界角。对于沿偏置方向施加的场,在MnPd层的临界厚度处,180°磁性反转从两个连续的90°畴壁成核变为单个180°畴壁成核。

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