Inhomogeneous electronic properties of monolayer graphene on Ru(0001)

著录项

• 来源
  《Physical review》 |2011年第15期|p.153418.1-153418.4|共4页
• 作者

  M. Gyamfi; T. Eelbo; M. Wasniowska; R. Wiesendanger;

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• 作者单位

  Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany;

  Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany;

  Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany;

  Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany;

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• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  microscopy of surfaces; interfaces; and thin films; thin film structure and morphology; direct observation of dislocations and other defects (etch pits; decoration; electron microscopy; x-ray topography; etc.);

  机译：表面显微镜;接口;薄膜;薄膜结构和形态;位错和其他缺陷（蚀刻凹坑;装饰;电子显微镜;x射线形貌等）的直接观察;