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Temporal universal conductance fluctuations in RuO_2 nanowires due to mobile defects

机译:由于移动缺陷,RuO_2纳米线的时间通用电导波动

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摘要

Temporal universal conductance fluctuations (TUCF's) are observed in RuO_2 nanowires at cryogenic temperatures. The fluctuations persist up to very high T ~ 10 K. Their root-mean-square magnitudes increase with decreasing T, reaching ~ 0.2e~2/ h at T < 2 K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF's as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.
机译:在低温下,在RuO_2纳米线中观察到时间普遍电导波动(TUCF)。波动持续到非常高的T〜10K。它们的均方根值随着T的减小而增加,在T <2 K时达到〜0.2e〜2 / h。这些波动被证明是由于导电电子的散射引起的。人工合成的金属氧化物纳米线中大量的移动缺陷。一维饱和和不饱和状态下的TUCF特性都是根据当前理论确定和解释的。此外,还讨论了TUCF作为移动缺陷(两级系统)特征时标的探针。

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