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Measuring the corrugation amplitude of suspended and supported graphene

机译：测量悬浮和支撑石墨烯的波纹幅度

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摘要

Nanoscale corrugation is a fundamental property of graphene arising from its low-dimensional nature. It places a fundamental limit to the conductivity of graphene and influences its properties. However the degree of the influence of the corrugation has not been well established because of the little knowledge about its spectrum in suspended graphene. We present a transmission electron microscopy technique that enables us to measure the average corrugation height and length. We applied the technique also to measure the temperature dependence of the corrugation. The difference in corrugation between suspended and supported graphene has been illustrated.
机译：纳米级波纹是石墨烯的低尺寸性质，是其基本特性。它对石墨烯的电导率设置了基本限制，并影响了其性能。然而，由于对悬浮石墨烯中的光谱知之甚少，波纹的影响程度尚未很好地确定。我们提出了一种透射电子显微镜技术，使我们能够测量平均波纹高度和长度。我们还将该技术应用于测量波纹的温度依赖性。已经说明了悬浮石墨烯和负载石墨烯之间的波纹差异。

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