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Phase diagram of magnetic nanodisks measured by scanning electron microscopy with polarization analysis

机译：磁性纳米磁盘的相图通过扫描电子显微镜与极化分析测量

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摘要

We use scanning electron microscopy with polarization analysis (SEMPA) to image the magnetic domain structures of individual ferromagnetic nanodisks with different diameters and thicknesses, and thereby determine the phase diagram of the magnetic ground states in these technologically important magnetic structures. Depending on the nanodisk dimensions, we observe magnetic structures based on one of three configurations: a single-domain in-plane, a single-domain out-of-plane, or a vortex state. By imaging the in-plane and out-of-plane magnetization components of identically prepared Ni_(80)Fe_(15)Mo_5 nanodisks with diameters that range from 35 to 190 nm and with thicknesses that range from 10 to 65 nm, we are able to locate phase boundaries between the three different phases and the triple point. The phase boundaries are not sharply defined, however. Near the boundaries and especially near the triple point, we observe disks in a mixture of the different metastable ground phases, and we observe variations of the basic states, such as a tilted vortex configuration. A magnetic phase diagram generated by a micromagnetic simulation is found to be in good qualitative agreement with the phase diagram determined by the SEMPA measurements. The ability to determine the magnetic phases in sub-100 nm nanodisks enables tailoring material properties and geometry of nanodisks for various potential applications.
机译：我们使用带有极化分析（SEMPA）的扫描电子显微镜对具有不同直径和厚度的单个铁磁纳米磁盘的磁畴结构进行成像，从而确定这些技术上重要的磁结构中的磁性基态的相图。根据纳米磁盘的尺寸，我们观察到基于以下三种配置之一的磁性结构：单畴平面内，单畴平面外或涡旋状态。通过对直径相同的Ni_（80）Fe_（15）Mo_5纳米磁盘的平面内和平面外磁化分量进行成像，其直径范围从35到190 nm，厚度范围从10到65 nm，我们能够在三个不同相位和三相点之间定位相位边界。但是，相位边界并未明确定义。在边界附近，尤其是在三重点附近，我们观察到了处于不同亚稳态基相混合物中的圆盘，并且观察到了基本状态的变化，例如倾斜的涡旋结构。发现由微磁模拟产生的磁相图与由SEMPA测量确定的相图在质量上具有一致性。确定低于100 nm纳米磁盘中磁相的能力使得可以为各种潜在应用定制纳米磁盘的材料特性和几何形状。

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  • 来源
    《Physical review》 |2010年第2期|024410.1-024410.7|共7页
  • 作者

    S.-H. Chung; R. D. McMichael; D. T. Pierce; J. Unguris;

  • 作者单位

    Center for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, USA;

    Center for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

    Center for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

    Center for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

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