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Direct method for imaging elemental distribution profiles with long-period x-ray standing waves

机译:用长周期X射线驻波成像元素分布轮廓的直接方法

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摘要

A model-independent Fourier-inversion method for imaging elemental profiles from multilayer and total-external reflection x-ray standing wave (XSW) data is developed for the purpose of understanding the assembly of atoms, ions, and molecules at well-defined interfaces in complex environments. The direct-method formalism is derived for the case of a long-period XSW generated by low-angle specular reflection in an attenuating overlayer medium. It is validated through comparison with simulated and experimental data to directly obtain an elemental distribution contained within the overlayer. We demonstrate this formalism by extracting the one-dimensional profile of Ti normal to the surface for a TiO_2/Si/Mo trilayer deposited on a Si substrate using the Ti Kα fluorescence yield measured in air and under an aqueous electrolyte. The model-independent results demonstrate reduced coherent fractions for the in situ results associated with an incoherency of the x-ray beam (which are attributed to fluorescence excitation by diffusely or incoherently scattered x-rays). The uniqueness and limitations of the approach are discussed.
机译:开发了一种与模型无关的傅立叶反演方法,用于从多层和全外反射X射线驻波(XSW)数据中成像元素轮廓,以了解原子,离子和分子在结构明确的界面中的组装情况。复杂的环境。对于在衰减覆盖层介质中通过低角度镜面反射生成的长周期XSW的情况,可以导出直接方法形式主义。通过与模拟和实验数据进行比较来验证它,以直接获得覆盖层中包含的元素分布。我们通过使用在空气中和在水性电解质中测得的TiKα荧光产率,提取垂直于表面的Ti的一维轮廓来表示沉积在Si衬底上的TiO_2 / Si / Mo三层膜的一维形式。与模型无关的结果表明,与x射线束的非相干性相关的原位结果的相干分数降低了(这归因于由散射或非相干散射的x射线引起的荧光激发)。讨论了该方法的独特性和局限性。

著录项

  • 来源
    《Physical review》 |2010年第5期|p.054112.1-054112.14|共14页
  • 作者单位

    Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439, USA;

    Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA;

    Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    structure, measurements and simulations; X-ray standing waves;

    机译:结构;测量和模拟;X射线驻波;

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