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Theoretical intrinsic lifetime limit of shallow donor states in silicon

机译:硅中浅施主态的理论固有寿命极限

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摘要

The intrinsic lifetime of the 2p_0 shallow impurity state in silicon doped with P, As, Sb, or Bi has been computed by combining matrix elements of the electron-phonon coupling within the density-functional perturbation theory, with the envelope function approximation for the impurity wave functions. The theoretical lifetime due to the electronic interaction with intervalley phonons has been found to be 1.1 ns for P-doped silicon, and this theoretical limit is much longer than has been previously believed for the last five decades.
机译:通过在密度泛函微扰理论中结合电子-声子耦合的矩阵元素和杂质的包络函数近似,可以计算出掺杂有P,As,Sb或Bi的硅中2p_0浅杂质态的本征寿命。波函数。对于掺P的硅,已经发现由于其与间隔子声子的电子相互作用而导致的理论寿命为1.1 ns,并且该理论极限比过去五十年来的预期更长。

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