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Edge structure of epitaxial graphene islands

机译:外延石墨烯岛的边缘结构

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摘要

Graphene islands grown epitaxially on 6H-SiC(0001) were studied using scanning tunneling microscopy and spectroscopy. Under specific growth conditions, ≈ 10 nm single-layer graphene islands are observed on top of the SiC buffer layer and align with the SiC(0001)-1 × 1 lattice directions. Atomic-resolution images show that the edges of the island closely follow an armchair-edge configuration.
机译:使用扫描隧道显微镜和光谱学研究了在6H-SiC(0001)上外延生长的石墨烯岛。在特定的生长条件下,在SiC缓冲层的顶部观察到≈10 nm的单层石墨烯岛,并与SiC(0001)-1×1晶格方向对齐。原子分辨率图像显示,岛的边缘紧贴扶手椅边缘。

著录项

  • 来源
    《Physical review》 |2010年第24期|P.245408.1-245408.4|共4页
  • 作者单位

    School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA Center for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

    rnCenter for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA Argonne National Laboratory, Argonne, IL 60439-4806;

    rnCenter for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

    rnSchool of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA;

    rnCenter for Nanoscale Science and Technology, NIST, Gaithersburg, Maryland 20899, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    scanning tunneling microscopy (including chemistry induced with STM);

    机译:扫描隧道显微镜(包括用STM诱导的化学反应);

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