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Real-space Ion Scattering Maps Of The Mg(0001) Surface

机译：Mg（0001）表面的实空间离子散射图

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Low-energy ion scattering (LEIS) is useful for examining the structure of ordered surfaces as well as for identifying surface atoms. However, in some cases the structural information from LEIS measurements is obscured by complex collision processes which contribute to the detected scattering intensity. In this study, we have developed a more precise approach for examining surface structure that includes comparing experimental real-space ion scattering maps with simulations from binary collision codes using reliability factors. This method is demonstrated with the model system 2 keV Ne~+→Mg(0001). Using an angle-resolved ion energy spectrometer, the intensity of scattered Ne~+ from the surface was recorded for a complete set of polar and azimuthal angles, which define the orientation of the surface with respect to the incident beam. These angles were then transformed to distances in real space and used to compile an ion scattering map of the Mg(0001) surface. A simulated map was also generated for the same conditions using a modified version of the binary collision code marlowe. The maps provide a comprehensive overview of surface scattering and allow the locations of surface atoms to be correlated directly to regions of enhanced scattering intensity. The sensitivity of the LEIS signal to interatomic spacing was simulated using marlowe, and methods for comparing with experiments were developed. Because LEIS can distinguish different types of atoms on the surface, the techniques described here could be extended to map compound surfaces and adsorbates.
机译：低能离子散射（LEIS）可用于检查有序表面的结构以及识别表面原子。但是，在某些情况下，来自LEIS测量的结构信息会被复杂的碰撞过程所掩盖，这会影响检测到的散射强度。在这项研究中，我们开发了一种更精确的方法来检查表面结构，其中包括将实验真实空间离子散射图与使用可靠性因子的二进制碰撞代码进行的仿真进行比较。模型系统2 keV Ne〜+→Mg（0001）演示了该方法。使用角度分辨离子能谱仪，记录了从表面散射的Ne〜+的强度，以求出一组完整的极性和方位角，这些角度定义了表面相对于入射束的方向。然后将这些角度转换为实际空间中的距离，并用于编译Mg（0001）表面的离子散射图。使用二进制碰撞代码marlowe的修改版本，还针对相同条件生成了模拟图。这些图提供了表面散射的全面概述，并使表面原子的位置直接与增强散射强度的区域相关。利用Marlowe模拟了LEIS信号对原子间间距的敏感性，并开发了与实验进行比较的方法。由于LEIS可以区分表面上不同类型的原子，因此此处描述的技术可以扩展为映射化合物表面和被吸附物。

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