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Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

机译:氧化铜的共振非弹性X射线散射光谱和介电损耗函数的比较

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摘要

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi_2CuO_4, CuGeO_3, Sr_2Cu_3O_4Cl_2, La_2CuO_4, and Sr_2CuO_2Cl_2, and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi_2CuO_4 and CuGeO_3.
机译:我们报告在布里渊区中心拍摄的Cu K边缘间接共振非弹性x射线散射(RIXS)光谱的经验比较,在多种氧化铜中测得的光介电损耗函数。针对Bi_2CuO_4,CuGeO_3,Sr_2Cu_3O_4Cl_2,La_2CuO_4和Sr_2CuO_2Cl_2获得RIXS数据,并通过考虑入射和散射光子共振进行分析。然后提取事件能量无关的响应函数。用椭圆偏振光谱法测量的介电损耗函数与此RIXS响应非常吻合,尤其是在Bi_2CuO_4和CuGeO_3中。

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