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When to trust photoelectron spectra from Kohn-Sham eigenvalues: The case of organic semiconductors

机译:何时信任Kohn-Sham特征值的光电子能谱:有机半导体的情况

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摘要

The combination of photoelectron spectroscopy and density functional theory is an important technique for clarifying a material's electronic structure. So far, however, it has been difficult to predict when the spectrum of occupied Kohn-Sham eigenvalues obtained from commonly used (semi-)local functionals bears physical relevance and when not. We demonstrate that a simple criterion based on evaluating each orbital's self-interaction allows prediction of the physical reliability of the eigenvalue spectrum. We further show that a self-interaction correction significantly improves the interpretability of eigenvalues also in difficult cases such as organic semiconductors where (semi-)local functionals fail.
机译:光电子能谱学与密度泛函理论的结合是阐明材料电子结构的一项重要技术。但是,到目前为止,很难预测从常用的(半)局部函数获得的占据的Kohn-Sham特征值的频谱何时具有物理相关性,何时不具有物理相关性。我们证明,基于评估每个轨道的自相互作用的简单标准可以预测特征值谱的物理可靠性。我们进一步表明,在困难的情况下(例如(半)局部功能失败的有机半导体),自交互校正也显着提高了特征值的可解释性。

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  • 来源
    《Physical review》 |2009年第20期|201205.1-201205.4|共4页
  • 作者单位

    Physikalisches Institut, Universitaet Bayreuth, D-95440 Bayreuth, Germany;

    Physikalisches Institut, Universitaet Bayreuth, D-95440 Bayreuth, Germany;

    Department of Materials and Interfaces, Weizmann Institute of Science, Rehovoth 76100, Israel;

    Department of Materials and Interfaces, Weizmann Institute of Science, Rehovoth 76100, Israel;

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