Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies

S. Perisanu; V. Gouttenoire; P. Vincent; A. Ayari; M. Choueib; M. Bechelany; D. Cornu; S. T. Purcell

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Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies

机译：通过扫描电子和场发射显微镜确定的SiC纳米线的机械性能

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We present here comparative measurements by scanning electron microscopy (SEM) and field emission (FE) of the mechanical resonances of singly clamped, batch-fabricated SiC nanowires as well as an extensive theoretical description. The mechanical resonance

机译：我们在这里通过扫描电子显微镜（SEM）和场发射（FE）对单钳位，批量制造的SiC纳米线的机械共振进行比较测量，并进行广泛的理论描述。机械共振

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来源
《Physical review》 |2008年第16期|1100-1111|共12页
作者
S. Perisanu; V. Gouttenoire; P. Vincent; A. Ayari; M. Choueib; M. Bechelany; D. Cornu; S. T. Purcell;
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正文语种 eng
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field emission; ionization; evaporation; and desorption; nanotubes;

机译：场发射;电离;蒸发;和解吸;纳米管;

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Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies

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