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首页> 外文期刊>Physical review. B, Condensed Matter And Materals Physics >Off-axis electron holography and microstructure of Ba_(0.5)Sr_(0.5)TiO_3 thin films on LaAlO_3
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Off-axis electron holography and microstructure of Ba_(0.5)Sr_(0.5)TiO_3 thin films on LaAlO_3

机译：LaAlO_3上Ba_（0.5）Sr_（0.5）TiO_3薄膜的离轴电子全息图和显微结构

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摘要

Epitaxial Ba_(0.5)Sr_(0.5)TiO_3 thin films grown on the (001) LaAlO_3 substrates with a ferroelectric transition at about 250 K have been investigated by TEM and off-axis electron holography. Cross-sectional TEM observations show that the 350-nm-thick Ba_(0.5)Sr_(0.5)TiO_3 film has a sharp interface with notable misfit dislocations. Off-axis electron holographic measurements reveal that, at low temperatures, the ferroelectric polarization results in a remarkable positive potential on the interface and a negative potential on the film surface, and, at room temperature, certain charges could only accumulate at the interfacial dislocations and other defective areas.
机译：已经通过TEM和离轴电子全息图研究了在（001）LaAlO_3衬底上生长的铁电跃迁约为250 K的外延Ba_（0.5）Sr_（0.5）TiO_3薄膜。截面TEM观察表明，厚度为350 nm的Ba_（0.5）Sr_（0.5）TiO_3薄膜具有清晰的界面，具有明显的失配位错。离轴电子全息测量表明，在低温下，铁电极化会在界面上产生显着的正电势，而在膜表面上产生负电势，并且在室温下，某些电荷只能在界面位错和其他缺陷区域。

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