首页> 外文期刊>Physical review >Carbon vacancy-related centers in 3C-silicon carbide: Negative-U properties and structural transformation
【24h】

Carbon vacancy-related centers in 3C-silicon carbide: Negative-U properties and structural transformation

机译:3C-碳化硅中碳空位相关中心:负-U性质和结构转型

获取原文
获取原文并翻译 | 示例
           

摘要

Combining electron paramagnetic resonance (EPR) spectroscopy and first-principles density functional theory calculations we have identified the carbon monovacancy center and a second carbon vacancy-related defect, the carbon vacancy-carbon anlisite defect in 3C-SiC. In close analogy to the vacancy in silicon, the carbon vacancy in 3C-SiC with its four potentially equivalent silicon dangling bonds shows a strong Jahn-Teller effect, confirming previously predicted negative-U properties. High-temperature annealing (above 700 °C) of electron or proton irradiated samples anneals out the primary silicon monovacancies and generates a new defect, which we assign to the carbon vacancy-carbon antisite complex. As predicted by theory, this defect is the result of a structural instability of the silicon vacancy in the positive charge state, which transforms at high temperatures according to V_(Si)C_4 → V_CC_(Si)C_3. Both defects are deep donors and thus not suitable for achieving semi-insulating properties.
机译:结合电子顺磁共振(EPR)光谱和第一原理密度函数理论计算,我们已鉴定碳单透视中心和第二碳空位相关的缺陷,3C-SiC中的碳空位 - 碳含量缺陷。与硅中的空位紧密相比,3C-SiC中的碳空位具有四个潜在的等效硅悬空键,显示出强烈的Jahn-externer效应,确认先前预测的负-U属性。电子或质子辐照样品的高温退火(700℃以上)退出初级硅单遗址并产生新的缺陷,我们分配到碳空位 - 碳反烧结复合物。如本文所预测的,该缺陷是正电荷状态下硅空位的结构不稳定性的结果,其在根据V_(Si)C_4→V_CC_(Si)C_3的高温下变换。这两种缺陷都是深供料,因此不适合实现半绝缘性能。

著录项

  • 来源
    《Physical review》 |2020年第18期|184108.1-184108.8|共8页
  • 作者单位

    Sorbonne Universite Institut des Nanosciences de Paris UMR 7588 au CNRS 4 place Jussieu. 75005 Paris France;

    University of Stavanger Institutt for Matematikk og fysikk Kristine Bonneviesvei 22 4036 Stavanger Norway;

    Department Physik Universitat Paderborn Warburger Strasse 100 33098 Paderborn Germany;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号