首页> 外文期刊>Physical review >Strain and electronic properties at the van der Waals interface of phosphorus/ boron nitride heterobilayers
【24h】

Strain and electronic properties at the van der Waals interface of phosphorus/ boron nitride heterobilayers

机译:磷/硼氮化物异质层Van der Wa界面处的应变和电子性质

获取原文
获取原文并翻译 | 示例
           

摘要

We study the mechanical and electronic properties of heterobilayers composed of black phosphorus (BP) on hexagonal boron nitride (hBN) and of blue phosphorus (P_(blue)) on hBN by means of ab initio density functional theory. Emphasis is put on how the stress applied on the constituent layers impact their structural and electronic properties. For this purpose, we adopt a specific scheme of structural relaxation which allows us to distinguish between the energy cost of distorting each layer and the gain in stacking them together. In most cases we find that the BP tends to contract along the softer armchair direction, as already reported for similar structures. This contraction can attain up to 5% of strain, which might deteriorate its very good transport properties along the armchair direction. To prevent this, we propose a twisted-bilayer configuration where the largest part of the stress applies on the zigzag axis, resulting in a lower impact on the transport properties of BP. We also investigated a P_(blue)/hBN bilayer. A peculiar hybridization between the valence states of the two layers lets us suggest that electron-hole pairs excited in the bilayer will exhibit a mixed character, with electrons localized solely in the P_(blue) layer and holes spread onto the two layers.
机译:我们通过AB Initio密度函数理论研究由六边形氮化硼(HBN)上的黑磷(BP)和六边形氮化物(HBN)上的黑磷(BP)和蓝磷(蓝色))组成的机械和电子性质。强调施加在组成层上的压力如何影响其结构和电子性质。为此目的,我们采用了结构松弛的特定方案,其允许我们区分扭曲各层的能量成本和将它们堆叠在一起的增益。在大多数情况下,我们发现BP沿着更柔软的扶手椅方向倾向于,如类似的结构。这种收缩可以达到高达5%的菌株,这可能沿着扶手椅方向劣化其非常好的运输性能。为了防止这种情况,我们提出了一种扭曲的双层配置,其中应力的最大部分施加在Z字形轴上,导致对BP的传输性能较低。我们还调查了一个p_(蓝色)/ hbn双层。两层的价态之间的特殊杂交使我们建议在双层中激发的电子孔对将表现出混合特性,电子单独地在P_(蓝色)层和孔铺展到两层上的孔。

著录项

  • 来源
    《Physical review》 |2020年第3期|035415.1-035415.11|共11页
  • 作者单位

    Laboratoire d'Etude des Microstructures ONERA-CNRS UMR104 Universite Paris-Saclay BP 72 92322 Chatillon Cedex France DEN - Service de Recherches de Metallurgie Physique (SRMP) CEA Saclay France;

    Laboratoire d'Etude des Microstructures ONERA-CNRS UMR104 Universite Paris-Saclay BP 72 92322 Chatillon Cedex France Universite de Paris Laboratoire Materiaux et Phenomenes Quantiques CNRS F-75013 Paris France;

    Laboratoire d'Etude des Microstructures ONERA-CNRS UMR104 Universite Paris-Saclay BP 72 92322 Chatillon Cedex France;

    Laboratoire d'Etude des Microstructures ONERA-CNRS UMR104 Universite Paris-Saclay BP 72 92322 Chatillon Cedex France;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号