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首页> 外文期刊>Pulse, IEEE >Novel In Vitro and In Vivo Neural Interfaces: Normal and Accelerated Failure Assessment
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Novel In Vitro and In Vivo Neural Interfaces: Normal and Accelerated Failure Assessment

机译：新型的体外和体内神经接口：正常和加速故障评估

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摘要

Neural implantation of devices and the subsequent tissue response are complex and cascading physical and biological phenomena. Creation of reliable neural interfaces remains a significant challenge. Penetrating central nervous system interfaces persist as the most challenging to realize but continue to be the most attractive because of the information bandwidth advantages they provide. This rich information source is essential for achieving next-generation prosthetic control. Specific challenges of penetrating central nervous system interfaces arise because of the reactive tissue response to the initial injury due to device insertion as well as the continued response due to device indwelling. These responses consist of biochemical signaling events, microglial activation, and astrogliotic cell reorganization that result in biophysical changes of the tissue near the implanted device and finally, electrophysiological neural cell/signal loss (Figure 1). The ultimate realization of reliable penetrating neural interfaces will require careful science and engineering approaches incorporating knowledge of relevant and critical biological, physical, and chemical factors, especially their interrelationship. In this article, we describe a comprehensive strategy to assess the reliability of penetrating central neural interfaces based on the biology and pathology of the injury and indwelling tissue responses. Our strategy involves a parallel, self-informing approach by simultaneous development of new in vitro and in vivo assessment techniques as well as using these state-of-the-art techniques to conduct accelerated lifetime assessments of neural interface degradation.
机译：装置的神经植入和随后的组织反应是复杂且级联的物理和生物学现象。创建可靠的神经接口仍然是一项重大挑战。穿透性中枢神经系统接口一直是实现挑战中最困难的，但由于它们提供的信息带宽优势，它们仍然是最具吸引力的。丰富的信息源对于实现下一代义肢控制至关重要。穿透中枢神经系统界面的具体挑战是由于对由于器械插入引起的初始损伤的反应性组织反应以及由于器械滞留引起的持续反应而引起的。这些反应包括生化信号事件，小胶质细胞活化和星形胶质细胞重组，导致植入装置附近组织的生物物理变化，最后导致电生理神经细胞/信号丢失（图1）。可靠的穿透性神经接口的最终实现将需要谨慎的科学和工程方法，并结合相关和关键的生物学，物理和化学因素的知识，尤其是它们之间的相互关系。在本文中，我们描述了一种基于损伤和留置组织反应的生物学和病理学评估穿透中枢神经接口可靠性的综合策略。我们的策略涉及到一种并行的，自我告知的方法，该方法通过同时开发新的体外和体内评估技术以及使用这些最新技术来进行神经接口退化的加速寿命评估。

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  • 来源
    《Pulse, IEEE》 |2012年第1期|p.27-29|共3页
  • 作者

    Otto K.J.; Williams J.C.;

  • 作者单位

    Department of Biological Sciences and Weldon School of Biomedical Engineering, Purdue University, West Lafayette, Indiana.;

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