Measuring circuits used in an automatic transistor tester

Sparkes J.J.

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Measuring circuits used in an automatic transistor tester

机译：自动晶体管测试仪中使用的测量电路

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A machine which is capable of testing, sorting and measuring all the significant parameters of germanium r.f. alloy transistors at a rate of 1200 transistors per hour is described. Since the machine uses essentially only one test head, each measuring circuit, which is mounted on a printed circuit card, is connected in turn to this test head by means of dry reed relays. The paper describes how 10 d.c. parameters and 7 a.c. measurements and tests are carried out on each transistor and explains some of the circuits in detail. In addition the relative merits of single test station and multi-test station machines are discussed.

机译：一台能够测试，分类和测量锗r.f.的所有重要参数的机器。描述了以每小时1200个晶体管的速率的合金晶体管。由于机器基本上只使用一个测试头，因此安装在印刷电路板上的每个测量电路都通过干簧继电器依次连接到该测试头。本文介绍了如何在10 d.c.参数和7 a.c.在每个晶体管上进行测量和测试，并详细说明一些电路。此外，还讨论了单测试台机器和多测试台机器的相对优点。

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《Radio Engineers, Journal of the British Institution of》 |1962年第6期|共10页
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Sparkes J.J.;
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1. The authors' replies to the discussions on ????????A versatile transistor circuit????????, ????????The measurement of the small-signal characteristics of transistors????????, ????????A bridge for measuring the a.c. parameters of point-contact transistors???????? and ????????The transistor regenerative amplifier as a computer element???????? [J] . Cooke-Yarborough E.H., Florida C.D., Stephen J.H., Proceedings of the IEE - Part III: Radio and Communication Engineering . 1954,第73期

机译：作者对有关“通用晶体管电路”，“晶体管小信号特性的测量”的讨论的答复。 ??????，????????用于测量交流电的电桥点接触晶体管的参数以及晶体管再生放大器作为计算机元件。
2. Discussion on ????????A versatile transistor circuit????????, ????????The measurement of the small-signal characteristics of transistors????????, ????????A bridge for measuring the a.c. parameters of point-contact transistors???????? and ????????The transistor regenerative amplifier as a computer element???????? before the Radio and Measurements Sections, 7th April, 1954 [J] . Proceedings of the IEE - Part III: Radio and Communication Engineering . 1954,第73期

机译：关于通用晶体管电路的讨论晶体管的小信号特性的测量??????用于测量交流电的电桥点接触晶体管的参数以及晶体管再生放大器作为计算机元件。 1954年4月7日在无线电和测量部门面前
3. Switched Current Circuit using Fixed Gate-Potential Transistor and Automatic Tuning Circuit [J] . Hirotomo Ishii, Shigetaka Takagi, Nobuo Fujii 電気学会論文誌. C . 1997,第8期

机译：使用固定栅极电位晶体管和自动调谐电路的开关电流电路
4. Automatic Modeling of Transistor Level Circuits by Hybrid Systems with Parameter Variable Matrices [C] . Ahmad Tarraf, Lars Hedrich International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design . 2019

机译：参数可变矩阵混合系统对晶体管级电路的自动建模
5. Transistor placement algorithm for automatic layout synthesis of CMOS/BiCMOS logic and interface circuits. [D] . Xia, Hongxia. 1994

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6. An Automated Reverse-Bias Second-Breakdown Transistor Tester [O] . David Berning 1991

机译：自动化的反向偏置二次击穿晶体管测试仪
7. Methods for Measuring and Characterizing Transistor and Diode Large Signal Parameters for Use in Automatic Circuit Analysis Programs [O] . W. H. Sullivan, J. L. Wirth 1965

机译：用于测量和表征晶体管的方法和二极管用于自动电路分析程序的大信号参数

Measuring circuits used in an automatic transistor tester

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