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A Literature Review on Planning and Analysis of Multi-stress Accelerated Life Test for Reliability Assessment

机译：多应力加速寿命试验规划与可靠性评估的文献综述

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摘要

Background: Multi-stress accelerated life test (MALT) has obtained increasing attention in reliability assessment due to its advantages. Started with constant-stress ALT with two stress variables, MALT has developed a lot during the past decades. In MALT, the design of the test plan and data analysis are two crucial aspects. Numerous researchers have discussed these two aspects and some important methods of planning and data analysis for MALT are presented. Methods: We first conducted a survey in the journal databases including Elsevier, Springer, IEEEXplore, Wiley and Taylor & Francis; and patent databases like Spacenet, USPTO and WIPO. Then we revised the literature including patents comprehensively on the planning and analysis of multistress ALT. Results: Optimal designs for MALT under different stress loadings are summarized, and different types of statistical inference methods are categorized and introduced. Finally, some challenges and research trends are discussed for future study.
机译：背景：多应力加速寿命测试（麦芽）由于其优点而在可靠性评估中获得了越来越关注。在过去的几十年中，麦尔特已经开发了两个压力变量的恒定压力变量。在麦芽中，测试计划和数据分析的设计是两个至关重要的方面。许多研究人员讨论了这两个方面，并提出了一些重要的规划和数据分析方法。方法：我们首先在包括elestvier，springer，Ieeexplore，Wiley和Taylor＆amp的日记数据库中进行了一项调查;弗朗西斯;和专利数据库，如Spacenet，USPTO和WIPO。然后，我们修改了文献，包括全面的专利，对Mulssress Alt的规划和分析进行了全面。结果：总结了不同应力负载下的麦芽的最佳设计，分类和介绍了不同类型的统计推理方法。最后，讨论了一些挑战和研究趋势为未来的研究。

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